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CIX100

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OLYMPUS CIX100 Turnkey Technical Cleanliness Inspection System: Simplify Your Technical Cleanliness

The cleanliness of components and parts is at the center of the manufacturing process. Meeting high standards for counting, analyzing, and classifying the often micron-sized contaminant and foreign particles is important for all processes: development, manufacturing, production, and quality control of the final product. International and national directives describe the methods and documentation requirements for determining particle contamination on essential machined parts since these particles directly impact the lifespan of parts and components. Previously, the mass of residue particles was used to characterize the residue. The standards in use today demand more detailed information about the nature of the contamination such as the number of particles, particle size distribution, and particle characteristic.
The OLYMPUS CIX100 Cleanliness Inspection System is designed to meet the cleanliness requirements of modern industry and national and international directives.

The technical cleanliness of components and parts is essential, especially in the automotive and aerospace industries.

Standard Process for Cleanliness Inspection: Preparation and Investigation
(01:Extraction, 02:Filtration, 03:Weighing, 04:Inspection, 05:Review, 06:Results)

Simple and Reliable

Seamlessly integrated hardware and software result in a durable, high-throughput system that delivers reliable and accurate data.

Easy Setup for True Turnkey Functionality
Accurate repeatability and best secure by invariant system setup
Excellent optical performance and reproducible imaging conditions
Proven durability by reproducible positioning and integrated calibration device
Full system integration for high performance

Intuitive Guidance for Maximum Productivity

Dedicated, easy-to-use workflows minimize user action and guarantee reliable data － independent of the operator and experience level.

Step-by-step guidance to improve productivity and reduce inspection and process time
User right management to restrict functionality and avoid avoids operator handling errors by restricting functionality
Touch screen support for efficient operator handling
Compliant One-Click Reporting for direct documentation
Data Management by automated results storing and sharing options

Fast Live Analysis

The unique all-in-one-scan solution enables scans to be completed twice as fast as other inspection systems. Counted and sorted particles are displayed live while powerful, easy-to-use tools make it easy to revise inspection data.

Overview image for direct identification of filter coverage, particle clustering or worst particles
Automatic live processing and classification of contaminant particles ranging from 2.5 µm up to 42 mm
High Throughput by unique all-in-one-scan technology for detection of both reflective and non-reflective objects in one scan
Live analytics and result display for shortest reaction time
Compliant results by support of international standards

Efficient Data Evaluation

Powerful and easy-to-use tools support to revise inspection data. Highest flexibility is guaranteed by support of all international standards. Clear representation of all relevant inspection results in a maximum time saving.

Clear arrangement of images and data for efficient data review
Visualization of different particle views for immediate identification
Proven guarantee as particle location and thumbnails linked with their dimensional images
Easy reclassification, review revision and recalculation of inspection data
Short reaction time by live display of overall cleanliness code, particle and classification tables
Full control by displaying complete inspection data set in one view

Compliant Report Creation

One-click reporting meets the requirements and methodologies set forth in international standards.

Completely intuitive and professional documentation based on compliant templates
Smart variability by customer adaptable templates
Utmost flexibility by support of various output formats
Efficient and time-optimized exchange by direct file sharing options
Sophisticated data storage options for long-term justification of results

Hardware
Microscope	OLYMPUS CIX100	Motorized focus	Coaxial motorized fine focus with 3 axis joystick
			Focus stroke 25mm
			Fine stroke 100 µm / rotation
			Maximum height of stage holder mounting : 40 mm
			Focus speed 200 µm/sec
			Software autofocus enabled
			Customizable multi-point focus map
		Illumination	Built-in LED illumination
			Innovative illumination mechanism with simultaneous detection of reflecting and non-reflecting particles
			Light intensity controllable by software
		Imaging device	Color CMOS USB 3.0 camera
		Imaging device	On chip pixel size 2.2 x 2.2 µm
		Sample height	Sample is limited to filter membrane (diameter 42 mm) mounted into the provided filter holder.
Nose piece	Motorized type	Motorized Nosepiece	6 positions motorized nosepiece with 3 UIS2 objectives already installed
			PLAPON 1.25X used for preview
			MPLFLN 5X used for detecting particles bigger than 10 µm
			MPLFLN 10X used for detecting particles bigger than 2.5 µm
		Software controlled	The image magnification and relation between pixel and size is known at every moment.
		Software controlled	Selected objectives are used at selected steps into the measurement process, objectives are automatically positioned
Stage	Motorized stage X,Y	Motorized stage X,Y	Stepper motors controlled movement
			Maximum range : 130 x 79 mm
			Max speed 240 mm/s (4 mm ball screw pitch)
			Repeatability < 1µm
			Resolution 0.01 µm
			Controllable with 3 axis joystick
		Software controlled	Scanning speed is depending on the used magnification, at 10x the scanning speed is less than 10 minutes
		Software controlled	Stage alignment is performed at factory assembly
	Specimen holder	Sample holder	Membrane holder is specially designed to avoid an unwanted rotation of the membrane during the mounting
			The membrane is mechanically flatten by the membrane holder
			No tool is needed to fix the cover
			The sample holder is always assigned the slot 1 on the stage
		Particle Standard Device (PSD)	Reference sample used to validate the system measurement
			Sample used in the check system built-in function for controlling the proper function of the CIX
			The PSD is always assigned slot 2 on the stage
	Stage insert	2-Position stage insert	Stage insert dedicated to the right positioning of the sample holder and the PSD
Controller	Workstation	High-Performance pre-installed workstation	HP Z440, Windows 10-64 bit Professional (English)
			16 GB RAM, 256 GB SSD and 4 TB data storage
			2GB video adapter
			Microsoft Office 2016 (English) installed
			Networking capabilities, English qwerty keyboard, optical mouse 1000 dpi
		Add-in boards	Motorized controller, RS232 serial and USB 3.0
		Language selection	Operating system and Microsoft Office default language can be changed by the user
	Touch panel display	23 inch slim screen	Resolution 1920x1080 optimized for use with the CIX software
Power		Rating	AC adapter (2), Controller and Microscope frame (4 plugs necessary)
		Rating	Input: 100-240V AC 50/60Hz, 10 A
		Power consumption	Controller: 700 W; Monitor: 56 W; Microscope: 5.8 W; Control Box 7.4 W
		Power consumption	Total: 769.2 W
Drawing		Dimensions (W × D × H)	Approx. 1300 mm × 800 mm × 510 mm
Drawing		Weight	44 kg