TBB Global Việt Nam

TBB Global Việt Nam

TBB Global Việt Nam

TBB Global Việt Nam
TBB Global Việt Nam

Product detail

DP75
Advanced Digital Microscope Camera for Challenging Applications Make your microscope inspections more efficient with the powerful DP75 digital microscope camera. This high-performance tool is tailored for a range of applications and enables you capture high-resolution brightfield, darkfield, MIX (brightfield and darkfield), polarization, DIC, fluorescence, and near-infrared (NIR) observation* images. * A microscope system for near-infrared observation is required
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Exceptional Imaging for Challenging Inspection Applications

Better Clarity and Precision

The DP75 digital microscope camera delivers sharp, low-noise inspection images.

Improved multiple-axis color correction technology delivers outstanding color fidelity for vivid reproductions and the RGB color reproducibility needed for printed materials, LCD color filters, and other applications.

A color paper samples captured at high magnification using the DP75 camera demonstrating outstanding color reproduction.

An image of printed paper

Fast Frame Rate at High Resolution

With a fast frame rate of 22 fps at over 4k resolution and 60 fps at full HD resolution, you can check live images while moving at a fast pace, speeding up your inspection and analysis workflow.

 A wafer sample captured at high magnification using the DP75 digital microscope camera.

An image of a wafer

High-Resolution Images at Low Magnification

The camera’s pixel shifting make it possible to capture high-resolution images even at low magnification with a maximum resolution of 8192 × 6000, enabling you to add greater visual detail to your inspection reports.

An image captured with the DP75 digital microscope camera demonstrating the image quality without pixel shifting on the left and with pixel shifting on the right.

Without pixel shifting (left) and with pixel shifting (right)

Flexible Upgrades  

Since the DP75 camera uses USB 3.1 Gen2, it is compatible with most PCs and can easily be bought as an upgrade for your current system.

Find Flaws Fast

A sample’s appearance can vary depending on the quality of the material, surface conditions, or illumination methods. To show samples accurately, the camera’s live high dynamic range (HDR) combines several images taken at different exposures to correct for brightness differences on the sample’s surface. Live HDR provides high-fidelity images that show not only textures but also flaws and defects that were previously undetectable. Glare is also reduced for more comfortable observation.

A pair of images captured with the DP75 digital microscope camera showing how the camera's high dynamic range shows bright and dark areas of the sample at the same time.

Halation removal via HDR
(Sample: a printed circuit board(PCB))

A pair of images captured with the DP75 digital microscope camera showing how high dynamic range enhances the images contrast.

Texture enhancement via HDR
(Sample: a printed circuit board (PCB))

An image captured with the DP75 digital microscope camera. The area outlined in red shows the field of view for the DP75 camera when used with the 0.63X TV adapter, while the area outlined in blue shows the field of view of the DP74 camera.

The DP75 camera’s field of view when used with the 0.63× camera adapter (red frame) compared to the DP74 (predecessor) camera’s field of view when used with the 0.63× camera adapter (blue frame).

See More in One Image

The camera's wide field of view (FN 26.5) enables you to quickly observe a large area, making your inspections faster and more efficient.

Easy Fluorescence to Infrared Imaging using the Same Microscope Camera

Engineered to excel in various applications, the DP75 camera integrates numerous benefits with a high-sensitivity cooled CMOS sensor and a switchable infrared (IR) cut filter. Benefits include:

Covers a wide range of wavelengths: the DP75 supports wavelengths from the visible light up to 1000 nm, enabling you to capture exceptional quality brightfield, darkfield, MIX (brightfield+darkfield), polarization, DIC, fluorescence, and NIR* observation images.

Clear fluorescence images with minimal noise: capture high-quality images even if the fluorescence is weak, which is helpful in applications such as examining resist residues.

* Requires a microscope system for NIR observation

An image of a BX3M microscope with a DP75 camera mounted on top, configured for near-infrared imaging.

 

A MIX (fluorescence+darkfield) observation image of a photoresist residue on a semiconductor wafer

A MIX (fluorescence+darkfield) observation image of a photoresist residue on a semiconductor wafer

A polarized observation image of a part of mineral

A polarized observation image of a part of mineral

A brightfield microscope observation image showing a flexible board

A brightfield observation image of a flexible board.

A near-infrared microscope observation image showing a flexible board.

A NIR observation image of a flexible board.

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