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measurement support software for measuring microscopes STM7

STM7-BSW is a measurement support software for measuring microscopes.
Not only is a live image acquired by digital camera and displayed on a monitor, but also observation,  measurements and report creation are possible on the same screen.
Therefore, the STM7-BSW improves your work efficiency.

More Accurate, Faster, and Simpler Measurement of Objects with Complex Shapes

The ability to clearly and easily see the output display component of measuring microscopes is essential. That is why the new Olympus measuring software has been created, helping to deliver complex measurements with greater accuracy. The software also enables the use of digital cameras.

STM7-BSW GUI
STM7-BSW Sample GU

Place the Sample and Start to Measure—No Parallel Alignment Required

Direct Measurement

direct_measurement

Measurements are made by receiving coordinates input via STM7.

Recall Measurement

tm7-bsw_recall_measurementOnce measured and calculated, coordinates can be used again for subsequent measurements. This eliminates the need to carry out the same work twice, enabling a smoother and more effi cient workflow.


direct_measurement_example

ecall_measurement_example


Virtual Point Measurement

virtual_point_measurementIntersections, central points, lengths,and a range of other measurements can be made by drawing straight lines and circles, which can then be set to remain as reference points on acquired sample images.

Alignment Measurement

alignment_measurement_listBoth the origin and the X-axis are set with respect to the sample, allowing the sample to be measured even when it’s not aligned with the stage.



 

 

alignment_measurement
Original axis
alignment_measurement_complete_setting
New axis

XZ Plane Measurement

xz_plane_measurement
 

Conventional measuring microscopes measure the XY plane directly from above. However in response to user demands, Olympus has incorporated an XZ plane measurement function in the STM7-BSW to enable the measurement of crosssections as seen from the side. Now measurements that used to be diffi cult are much easier—such as radius measurements for vertical sections of hemispherical objects, or measurement of the depths of grooves with curved bases compared to a reference line.

xz_plane_measurement_example1
R measurement of a hemispherical sample
xz_plane_measurement_example2
Height measurement of a groove from its base and the reference line

Record the Repeated Measurement Procedure

Macro Registration

Frequently used alignment and other measurement procedures can be combined and assigned to a single macro button—eliminating the need to start from scratch each time the microscope is set up.


Replay Measurement 

replay_measurement_list
 

Measurements can be easily repeated based on a recorded workflow by simply inputting the movement of the stage and the coordinates in response to a software prompt. This function can be used to repeatedly carry out the same measurement on the same sample, or diff erent versions of the same sample.
Furthermore, if a set value and tolerance are set in the recorded workfl ow, the software can automatically identify when a measurement has failed.

stm7-bsw_replay_measurement_result


Measurement Point Navigation for Replay Measurement

measurement_point_navigation_for_replay_measurement_conceptual_diagram
measurement_point_navigation_for_replay_measurement_gui
This function displays the direction and distance to the next measurement point, thereby eliminating any confusion on the part of the operator. The function additionally eliminates the need to check the next measurement point on the diagram each time, speeding the operator’s workflow through a series of repeated measurements.

Convenient Functions Eliminate Subjectivity in Measurement

Automatic Edge Detection

This function detects the edges of the sample and automatically acquires and measures its coordinates. As a result, operators no longer need to designate the coordinates and subjectivity is minimized. Automatic Edge Detection also features a timer function that enables coordinates to be acquired in a specified time and supports the use of a foot switch that enables the operator to focus on measurement operations without taking his or her hands off the stage handles.

automatic_edge_detection_circle
Automatic edge detection inside the circle
automatic_edge_detection_multi_points
Multiple points automatic edge detection

Abnormal Point Elimination

Metal burrs and other abnormal points can be excluded automatically during edge detection. This enables a consistent calculation of measured values, irrespective of the state of the sample. Points excluded as abnormal can also be displayed on the screen in diff erent colors.

abnormal_point_elimination_before_setting
Sample with abnormal point
abnormal_point_elimination_execute_function
Abnormal point elimination

Illumination Control 

illumination_control

The light intensity of the microscope can be maintained by accurate software control. Light intensity settings can also be saved when recording a workfl ow for replay measurement, enabling measurements to be made under the same conditions during replay measurements or automatic edge detection.


Automatic Magnification Recognition (optional, with coded revolving nosepiece configuration only)

Through use of the coded revolving nosepiece, previously set calibration values are automatically recalled when changing the objective. In this way, the user can always be confi dent that the proper scale is on display.

automatic_magnification_recognition



Customizable Report Generation

One-Click Report Generation

Measurement results can be output in Excel format with a single click, eliminating mistakes made during transcription. Images can also be pasted in along with the measurement results, enabling more effi cient report generation.

one-click_report_generation

Report sample


Advanced Acquisition Functions

Multiple Image Alignment (MIA) optional

Tile multiple images to capture a single high-magnifi cation, wide-area image. Because the images are tiled on the basis of coordinate data, the system is capable of producing highly reliable images.

multiple_image_alignment_sequence
multiple_image_alignment_after_acquistion

Extend Focus Image (EFI) optional

The EFI function is eff ective for obtaining images that are well-focused throughout on samples with an uneven, complex surface shape. Generate a single image with focal points aligned in all positions.
Simply process multiple images with diff erent focal point positions while moving the Z-axis, or use the motorized model for automated image composition.

extend_focus_image_sequence
拡張焦点-2
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