BTX II Compact Benchtop X-ray Diffraction System
The BTX II Benchtop XRD System is a fast, low cost, small footprint, benchtop XRD for full phase ID of major, minor and trace components and quick XRF scan of elements Ca - U. Its unique, minimal sample prep technique and sample chamber allow for fast, benchtop analysis rivaling the performance of large costly lab units.
The BTX II Benchtop X-ray Diffraction/X-ray Fluorescence is, simply put, the first combined XRD/XRF instrument designed with ease of use in mind. From educational settings, to the rigors of a QC application, BTX II is well suited. Based on the filled proven reliable design of TERRA, our field portable XRD/XRF instrument, BTX II features the same level of performance, but without the aspects of a portable instrument. The technology used in the portable rock and mineral analyzer received a prestigious R&D 100 award and was chosen to fly on the Mars Science Laboratory Rover scheduled for launch in 2011. Check out the NASA site for more.
The BTX II is a compact combination XRF/XRD system designed for powder analysis. Now XRD work can really be done in an easy to use, small footprint, low cost configuration. With the BTX II patented sample handling system, not only is sample preparation time minimized, but accuracy in peak identification previously only available using large and expensive laboratory based systems can now be achieved.
- Self-contained instrument
- Very simple sample preparation
- loose powders (~20mg of sample)
- sieve sample to <150µm
- Easy to use, single button operation
- True 2D powder XRD instrumentprovides image of XRD pattern
- See particle influences or preferred orientation
- Energy discrimination X-ray detector
- Eliminate Fluorescence, scatter and other background
- XRF spectral data for pattern confirmation
BTX II 's unique direct excitation CCD camera provides performance previously found only with lab based XRF/XRD instruments
Easy Sample Preparation
Typically, XRD experiments require a finely ground sample which is then pressed into a pellet. This requirement is formed by the need to ensure sufficient random orientation of the crystals in the sample. BTX II introduces a patented new way of addressing this issue. With only 15 mg of sample, BTX II convects the sample with its integrated sample vibration chamber. By doing so, BTX II is able to present all different orientations of the crystal structure to the instrument optics. This results in a superb XRD pattern, virtually free of problematic preferred orientation effects found using more classic preparation methods.
Loading the vibrating sample holder