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The cleanliness of components, parts, and fluids is at the center of the manufacturing process. Meeting high standards for counting, analyzing, and classifying the often micron-sized contaminants and foreign particles is important for:
Standard process for cleanliness inspection: preparation (steps 1–3) and investigation (steps 4–6). Step 1: extract, step 2: filter, step 3: weigh, step 4: inspect, step 5: review, step 6: results.
International and national directives describe the methods and documentation requirements for determining particle contamination on essential machined parts since these particles directly impact the lifespan of parts and components. Current standards demand detailed information about the nature of the contamination, such as the number of particles, particle size distribution, and particle characteristics.
The CIX100 cleanliness inspection system is designed to meet the cleanliness requirements of modern industry and national and international directives, and extends the possibilities of particle typing with deep-learning AI technology.
Seamlessly integrated hardware and software result in a durable, high-throughput system that delivers reliable and accurate data.
The innovative all-in-one-scan solution detects reflective (metallic) and non-reflective particles twice as fast as conventional methods that require two separate images. Immediate feedback of counted and sorted particles helps you make fast decisions.
Revise inspection data with powerful and easy-to-use tools that support company and international standards for cleanliness inspection. Clear representation of all relevant inspection results saves time.
One-click reporting meets the requirements and methodologies set forth in international standards. Report customization (e.g., including particle morphology), makes it easy to meet company standards.
The CIX100 system is a turnkey solution designed to meet the needs of automated cleanliness inspections. Each component is optimized for accuracy, reproducibility, repeatability, and seamless integration for reliable data in a high-throughput system. The system provides excellent optical performance for fast inspections of circular and rectangular sample areas. Automation of critical tasks helps speed up inspections while minimizing human errors and the risk of contaminating the sample.
1. Reproducible Imaging Conditions (Camera Cover)
Highest reproducibility by protected camera alignment to prevent unwanted misalignments.
2. Innovative Polarization Method (Detection Unit)
Detects both reflective (metallic) and non-reflective particles in a single scan.
3. Reproducible Measurement Conditions
The automatic focus drive helps ensure reproducible positioning for straightforward reinvestigation of detected contaminants.
4. Proven Durability (Stage/Stage Inserts)
The stage insert maintains a secured membrane position and features an additional insert for the integrated calibration tool or a second sample.
5. Excellent Optical Quality (Microscope)
Renowned UIS2 objectives and a high-resolution camera provide exceptional image quality and accurate measurements.
6. Easy to Use (Software)
Easy-to-use software guides users through the entire inspection process, helping to boost productivity and minimize errors. The interface has large buttons that are easy to click with a mouse or the touchscreen monitor.
7. High Performance (Workstation)
While scanning the sample, the system gives direct visual feedback of classified and counted contaminants with color changes. Optionally, the system can emit an acoustic warning signal when limits are exceeded.
The CIX100 system supports various sample holders with either circular or rectangular inspection areas. This includes holders with white or black backgrounds for filter membranes with a diameter of 25 mm, 47 mm, and 55 mm; holders for tape lift sampling; holders with a flat surface for metallurgy applications; and holders for particle traps.
Circular sample holders with white and black backgrounds for filter membranes with diameters of 25 mm (left), 47 mm (middle), and 55 mm (right).
Sample holder for particle traps
Sample holder for tape lift sampling
The CIX100 system offers a batch mode for the inspection of multiple samples at once. The scans can have similar inspection configurations or individual settings on each sample. After the inspection, it is possible to review the result of each sample separately and generate a report.
The cleanliness inspection workflow is easy, so even inexperienced operators can achieve accurate and repeatable results. The preconfigured and precalibrated system, user rights management, and regular system self-checks help ensure that the settings are correct for reproducible inspection data independent of the operator or system. As a result, multiple departments and sites can apply the same quality standards at different locations.
The diagram illustrates the CIX100 system’s precision by verifying the measurement stability and repeatability using the process performance index (Ppk). The same sample at 5X and 10X magnification was measured 10 times, and the particle count from typical size classes was extracted. The diagram shows the evaluation of Cpk and Ppk on class E (50–100 μm).
Our UIS2 objectives provide high optical performance for excellent measurement and analysis accuracy. A dedicated light source maintains a consistent color temperature optimized for cleanliness inspection.
The preconfigured and pre-calibrated system has reminders for automatic system self-checks with the integrated calibration slide that helps maintain regular system verification.
The optical path alignment, motorized nosepiece, and the camera are protected by a cover to prevent accidental modifications. For greater stability, all moving parts have been eliminated from the optical light path.
The CIX100 system delivers enhanced performance and productivity through the entire inspection process and makes technical cleanliness inspections easy for operators of every experience level. The software provides step-by-step guidance for the entire cleanliness inspection. Intuitive workflows and user rights management improve productivity and confidence in results while reducing cycle time, cost-per-test, and user errors. The result is a system optimized for high-quality standards.
The clearly structured user interface not only makes cleanliness inspection
The intuitive workflow guides users through the inspection process in three easy steps: Inspect Sample, Review Results, and Create Report. From scanning the sample to creating compliant reports, maximized automation improves ease of use during each step so that users of all experience levels can perform efficient inspections and produce reliable data.
Step by step, the intuitive interface guides operators through the complete inspection process. The result is a fast, productive workflow.
A preconfigured, pre-calibrated system combined with an intuitive user interface helps make cleanliness inspection easy for operators of every experience level.
The system reminds users to regularly perform automatic system checks for precise results, and pre-configured and customized system configurations support the operator’s daily work.
Microscope mode enables you to leave the dedicated cleanliness inspection workflow to perform microscopic imaging. Expand the microscope mode capabilities with optional material analysis solutions, such as:
This functionality can be extended with special functions customized for individual user needs
With integrated TruAI deep-learning technology, the CIX100 system provides image analysis beyond classical algorithms. You can apply a trained neural network to your samples for higher reproducibility and more robust analysis. The CIX100 TruAI solution enables the system to discriminate the detected particles in terms of particle type, such as reflecting versus non-reflecting.
All data are saved automatically. Users can quickly access all the archived samples, as well as their associated data and reports for revision or distribution.
Administrators can control which users have access to different parts of the system. This helps inexperienced users stay on task. Importantly, they also cannot influence critical parameters like calibration and data selected for the automatically generated report.
Administrators can access the complete system setup (top), while inexperienced users can be limited to basic workflows (bottom)
The interface has large buttons that are easy to click with a mouse or the touchscreen monitor.
Inspection configurations are used to specify all the parameters for sample inspection, including rules for the characterization of particles, setting particle families, and types.
The CIX100 system is already configured and calibrated when it is delivered but can be easily modified and customized to your applications and requirements.
The CIX100 system offers high-performance image acquisition and precise live analytics of both reflective and non-reflective particles ranging from 2.5 μm up to 42 mm in a single scan, thanks to a patented* polarization method. This all-in-one-scan solution enables scans to be completed twice as fast as the classical method (Inspector series). Counted and sorted particles are displayed live and sorted into size classes while the scan is acquired, supporting direct decision making and helping ensure a fast reaction time in case of a failed test.
All relevant data are displayed live on a single screen during the inspection, enabling the operator to stop or interrupt the inspection if a test fails.
An innovative polarization method based on wavelength separation and color detects both reflective (metallic) and non-reflective particles in a single scan. Integrated into the microscope frame, this high-throughput design enables scans to be completed twice as fast as the classical method (Inspector series) and eliminates moving components from the optical light path, such as the polarizer, which could negatively impact the system stability, leading to potentially incorrect results. This all-in-one-scan technique increases the number of inspected particles, reducing the cost per test and shortening the reaction time in case of a failed test.
1: Classical method, 2: Single-scan method
(1-1: First image of non-reflecting particles, 1-2: Second image of reflecting particles, 2: Single-scan solution: Combined)
An innovative polarization method detects both reflective (metallic) and non-reflective particles in a single scan.
Activating real color mode enables users to view particles in their actual colors, providing additional information to identify the particle type as metallic or non-metallic.
The all-in-one scan shows all reflective particles as blue in polarization, indicating these particles are metallic. In real color mode, the blue color of reflective particles is omitted, and the true colors of all particles are shown in the brightfield image. Materials that are actually blue remain blue, while metals show their metallic shine and the reflections typical for the material.
With these helpful visuals, users can better understand the nature of each particle and quickly confirm the particle type.
Particle as seen by the system during detection and analysis. The blue color indicates that this particle is metallic.
The same particle as seen during the review mode in real color using the U-ANT filter and the color correction mode. The particle is confirmed as metallic.
The sample overview image is created at the beginning of the sample inspection and displays the entire filter at low magnification. The overview image helps to identify filter coverage or particle clusters before the sample inspection starts.
If the filter assignment is higher than desired, the user is automatically informed and can react accordingly.
Inspection configurations are used to specify all parameters for sample inspection.
The sample information area lists the most important data.
Contaminants are automatically analyzed and sorted into size class bins defined by the selected standard and are color coded to clearly indicate which size class exceeds a predefined limit. A statistical control chart function visually illustrates the level of particle class compliance, for improved reliability.
Predefined acceptable particle counts per size classes are displayed, and the sample can be validated (OK) or rejected (NOK) even before the complete membrane is acquired.
Required by electric mobility industries and medical device industries, CIX100 v. 1.6 software enables users to evaluate approval limits for individual particle types.
An acoustic signal can be switched on when the approval reads NOK or the inspection is finished.
Live processing and classification of both small and large particles according to international standards (2.5 µm up to 42 mm).
Image stitching automatically reconstructs images of large particles.
Scan dark particles on a bright background or vice versa.
Clearly view the time remaining for sample acquisition.
The CIX100 system combines powerful, easy-to-use tools to revise inspection data with a fast, guided particle review. The one-click reclassification function provides flexibility and supports international standards. Thumbnail images of every contaminant detected by the system are linked with dimensional measurements, making it easy to review the data. Retrieving a contaminant’s information is simple. During the review process, the results are updated and displayed automatically in all views and size classification bins. This saves you time with clear representations of all relevant inspection results.
All particles and classification tables, overall cleanliness code, particle location, and the standard used appear in one view.
Clear arrangement of images, data, and results for immediate decision-making for reprocessing. At-a-glance display of complete inspection data in various selectable views. View images of particles organized from largest to smallest for all kinds of particles (reflective or non-reflective).
Visualization of different particle views, e.g., the largest reflective or non-reflective particles.
Based on the stored particle position information, the stage directly repositions at a selected particle position for further investigation and revision, such as with an Extended Focus Image (all-in-focus image, EFI) or a tailored solution for a height measurement.
Data statistical analysis can be performed over time and graphically displayed.
Individual images of a contaminant can be taken and processed for manual measurement confirmation and improved documentation.
Thumbnail images of contaminants are conveniently linked with their locations and dimensions. Selecting a thumbnail automatically drives the system to this contaminant.
Classification and particle tables show the results according to the selected standard and particle data, respectively.
Classification and particle tables list the results according to the selected standard.
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Hardware |
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Microscope |
OLYMPUS CIX100 |
Motorized focus |
Coaxial motorized fine focus with 3 axis joystick |
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Focus stroke 25mm |
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Fine stroke 100 µm / rotation |
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Maximum height of stage holder mounting : 40 mm |
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Focus speed 200 µm/sec |
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Software autofocus enabled |
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Customizable multi-point focus map |
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Illumination |
Built-in LED illumination |
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Innovative illumination mechanism with simultaneous detection of reflecting and non-reflecting particles |
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Light intensity controllable by software |
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Imaging device |
Color CMOS USB 3.0 camera |
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On chip pixel size 2.2 x 2.2 µm |
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Sample height |
Sample is limited to filter membrane (diameter 42 mm) mounted into the provided filter holder. |
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Nose piece |
Motorized type |
Motorized Nosepiece |
6 positions motorized nosepiece with 3 UIS2 objectives already installed |
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PLAPON 1.25X used for preview |
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MPLFLN 5X used for detecting particles bigger than 10 µm |
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MPLFLN 10X used for detecting particles bigger than 2.5 µm |
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Software controlled |
The image magnification and relation between pixel and size is known at every moment. |
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Selected objectives are used at selected steps into the measurement process, objectives are automatically positioned |
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Stage |
Motorized stage X,Y |
Motorized stage X,Y |
Stepper motors controlled movement |
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Maximum range : 130 x 79 mm |
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Max speed 240 mm/s (4 mm ball screw pitch) |
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Repeatability < 1µm |
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Resolution 0.01 µm |
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Controllable with 3 axis joystick |
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Software controlled |
Scanning speed is depending on the used magnification, at 10x the scanning speed is less than 10 minutes |
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Stage alignment is performed at factory assembly |
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Specimen holder |
Sample holder |
Membrane holder is specially designed to avoid an unwanted rotation of the membrane during the mounting |
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The membrane is mechanically flatten by the membrane holder |
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No tool is needed to fix the cover |
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The sample holder is always assigned the slot 1 on the stage |
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Particle Standard Device (PSD) |
Reference sample used to validate the system measurement |
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Sample used in the check system built-in function for controlling the proper function of the CIX |
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The PSD is always assigned slot 2 on the stage |
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Stage insert |
2-Position stage insert |
Stage insert dedicated to the right positioning of the sample holder and the PSD |
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Controller |
Workstation |
High-Performance pre-installed workstation |
HP Z440, Windows 10-64 bit Professional (English) |
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16 GB RAM, 256 GB SSD and 4 TB data storage |
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2GB video adapter |
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Microsoft Office 2016 (English) installed |
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Networking capabilities, English qwerty keyboard, optical mouse 1000 dpi |
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Add-in boards |
Motorized controller, RS232 serial and USB 3.0 |
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Language selection |
Operating system and Microsoft Office default language can be changed by the user |
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Touch panel display |
23 inch slim screen |
Resolution 1920x1080 optimized for use with the CIX software |
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Power |
Rating |
AC adapter (2), Controller and Microscope frame (4 plugs necessary) |
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Input: 100-240V AC 50/60Hz, 10 A |
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Power consumption |
Controller: 700 W; Monitor: 56 W; Microscope: 5.8 W; Control Box 7.4 W |
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Total: 769.2 W |
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Drawing |
Dimensions |
Approx. 1300 mm × 800 mm × 510 mm |
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Weight |
44 kg |
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