More Accurate, Faster, and Simpler Measurement of Objects with Complex Shapes

The ability to clearly and easily see the output display component of measuring microscopes is essential. That is why the new Olympus measuring software has been created, helping to deliver complex measurements with greater accuracy. The software also enables the use of digital cameras.

STM7-BSW Sample GUI

Capture Clear, Pin-Sharp Images for Highly Accurate Measurement with a Complete Lineup of Cameras

High performance model with high speed live display

Introductory model with high price-performance ratio

Place the Sample and Start to Measure—No Parallel Alignment Required

 

 

Original axis

New axis

XZ Plane Measurement

 

Conventional measuring microscopes measure the XY plane directly from above. However in response to user demands, Olympus has incorporated an XZ plane measurement function in the STM7-BSW to enable the measurement of crosssections as seen from the side. Now measurements that used to be diffi cult are much easier—such as radius measurements for vertical sections of hemispherical objects, or measurement of the depths of grooves with curved bases compared to a reference line.

R measurement of a hemispherical sample

Height measurement of a groove from its base and the reference line

Record the Repeated Measurement Procedure

Macro Registration

Frequently used alignment and other measurement procedures can be combined and assigned to a single macro button—eliminating the need to start from scratch each time the microscope is set up.

Replay Measurement 

 

Measurements can be easily repeated based on a recorded workflow by simply inputting the movement of the stage and the coordinates in response to a software prompt. This function can be used to repeatedly carry out the same measurement on the same sample, or diff erent versions of the same sample. 
Furthermore, if a set value and tolerance are set in the recorded workfl ow, the software can automatically identify when a measurement has failed.

Measurement Point Navigation for Replay Measurement

This function displays the direction and distance to the next measurement point, thereby eliminating any confusion on the part of the operator. The function additionally eliminates the need to check the next measurement point on the diagram each time, speeding the operator’s workflow through a series of repeated measurements.

Convenient Functions Eliminate Subjectivity in Measurement

Automatic Edge Detection

This function detects the edges of the sample and automatically acquires and measures its coordinates. As a result, operators no longer need to designate the coordinates and subjectivity is minimized. Automatic Edge Detection also features a timer function that enables coordinates to be acquired in a specified time and supports the use of a foot switch that enables the operator to focus on measurement operations without taking his or her hands off the stage handles.

Automatic edge detection inside the circle

Multiple points automatic edge detection

Abnormal Point Elimination

Metal burrs and other abnormal points can be excluded automatically during edge detection. This enables a consistent calculation of measured values, irrespective of the state of the sample. Points excluded as abnormal can also be displayed on the screen in diff erent colors.

Sample with abnormal point

Abnormal point elimination

Illumination Control 

The light intensity of the microscope can be maintained by accurate software control. Light intensity settings can also be saved when recording a workfl ow for replay measurement, enabling measurements to be made under the same conditions during replay measurements or automatic edge detection.

Automatic Magnification Recognition (optional, with coded revolving nosepiece configuration only)

Through use of the coded revolving nosepiece, previously set calibration values are automatically recalled when changing the objective. In this way, the user can always be confi dent that the proper scale is on display.

Advanced Acquisition Functions

Multiple Image Alignment (MIA) optional

Tile multiple images to capture a single high-magnifi cation, wide-area image. Because the images are tiled on the basis of coordinate data, the system is capable of producing highly reliable images.

Extend Focus Image (EFI) optional

The EFI function is eff ective for obtaining images that are well-focused throughout on samples with an uneven, complex surface shape. Generate a single image with focal points aligned in all positions. 
Simply process multiple images with diff erent focal point positions while moving the Z-axis, or use the motorized model for automated image composition.