TBB Global Việt Nam

TBB Global Việt Nam

TBB Global Việt Nam

TBB Global Việt Nam
TBB Global Việt Nam

Product detail

USPM-RU-W
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Near-Infrared Micro-Spectrophotometer

■ Reflectivity, Film thickness, Object color, and transmittance measured in seconds 
■ Wide range of wavelength from 380 to 1050 nm 
■ Measures reflectivity on curved surface without contact

Measure Reflectivity

Measure the reflectivity of a minute area with a diameter ranging from 17 to 70 um

Optical Path of Reflectivity Measurement
Optical Path of Reflectivity Measurement
Example of reflectivity measurement : len
Example of reflectivity measurement : lens
Example of reflectivity measurement : lens curvature
Example of reflectivity measurement : lens curvature

Film Thickness Measurement Screen-shot
Film Thickness Measurement Screen-shot

Measure Film Thickness

Use reflectivity data to measure the thickness of single-layer or multi-layer films of approximately 50 nm to 10 μm.


Object Color Measurement Screen-shot
Object Color Measurement Screen-shot

Measure Object Color

Display an XY chromaticity diagram, an L*a*b* chromaticity diagram, and their related numeric values based on reflectivity data.


Measure Transmission Levels (Available as an option)

Measure the transmittance of a plane sample by transmitting 2 mm parallel beams of lights through the sample to the spectrophotometry acceptance elements.

Optical Path of Transmittance Measurement
Optical Path of Transmittance Measurement

Measure Reflectivity at an Incidence Angle of 45 Degrees(Available as an option)

Measure the reflectivity at an incidence angle of 45 degrees by reflecting 2 mm parallel beams of lights to the spectrophotometry acceptance elements.

Optical Path of 45-degree Reflectivity Measurement
Optical Path of 45-degree Reflectivity Measurement

Fast Measurements of Curves Surfaces and Minute Areas


image010
Optical system image

Provides High-speed Measurement

Quick, high repeatability measurements can be achieved in seconds using a flat field grating, line sensor and high-speed spectrophotometry.


Small Parts reflectivity measurement
Image of reflectivity measurment

Optimally Suited for Reflectivity Measurement of Extremely Small Parts and Lenses

Olympus has designed a new dedicated objective lens that provides non-contact measurements across an area of 17 to 70 μm diameters. The new lens provides high repeatability on even curved surfaces or minute electronic parts.


Principle of backside reflection elimination
Principle of backside reflection elimination

Anti-reflection Processing is Not Required on the Back of the Sample

Accurate measurement of surface reflectivity can be performed without the costly steps needed to prevent rear surface reflection. Rear surface-reflected light is reduced by means of special optics that block all out-of-focus light reflection similar to a confocal system. Whether your optical component is spherical,aspherical or flat, the USPM-RU-W does not require sample preparation through anti-reflection treatments.


Available Film Thickness Measurement Methods

The single-layer or multi-layer film thickness can be analyzed according to the measured spectral reflectivity data. You can select the optimum measurement method for the application.


Peak valley film thickness analysis result
Peak valley film thickness analysis result

Peak-valley Method

This method is used to calculate film thickness based on the periods between the peaks and valleys of the measured spectral reflectivity value, and is effective for measuring single-layer film. No complicated settings are required, so measuring film thickness is easy.


Fourier transform film thickness analysis result
Fourier transform film thickness analysis result

Fourier Transform Method

This method is used to calculate film thickness based on the periods between measured spectral reflectivity values, and is effective for measuring single-layer and multilayer films. The Fourier transform method eliminates noise, thus making analysis possible when it is difficult to detect peak and valley values.


Curve fitting film thickness analysis result
Curve fitting film thickness analysis result

Curve Fit Method

This method is used to calculate film thickness by estimating which structure has the smallest difference between the measured spectral reflectivity and the calculated reflectivity for that structure, and is effective for measuring single-layer and multilayer films. The curve fit method also makes it possible to analyze thin film in which peak and valley values are not apparent.


Diverse application


Satisfies Diverse Measurement Needs at High Speed and With High Precision

Lens

Evaluation of Lens Coating for reflectivity,color and film thickness.

Mobile Phone Camera Lenses 
Projector Lenses 
Digital Camera Lenses 
Spectacle Lenses


Circuit Board

Examining the Reflectivity and Film Thickness of Minute Electronic Parts.

LED Packages 
Printed Circuit Boards


LCD Screen

Reflectivity, Film Thickness and Transmittance measurment of Planar Optical Elements.

LCD color filters 
Optical films


Prisms

Optical Elements Reflectivity at an Incident Angle of 45 Degrees.

Prisms 
Mirrors

Reflectivity measurement

Transmittance Measurement*1

Reflectivity Measurement for 45-Degrees*1

Name

NIR Micro-Spectrophotometer

Transmittance measurement set for NIR Micro-Spectrophotometer

45-degree reflectance measurement set for NIR Micro-Spectrophotometer

Model

USPM-RU-W

Measured wavelength

380 to 1050 nm

Measurement method

Compared with a reference sample for measurement

Transmissivity is measured with 100% as standard

Compared with a reference sample for measurement

Measurement range

See the specifications of the objective lens below

Approx. 2.0 mm in diameter

Measurement repeatability(3σ) *2

Reflectivity measurement

During use of 10x and 20x objective lenses

±0.02% or less (430 to 1010 nm) 

±0.3% or less (430 to 1010 nm) 

±0.2% or less (Except as described above)

±1.0% or less (Except as described above)

During use of a 40x objective lens

±0.05% or less (430 to 950 nm) 

 

±0.5% or less (Except as described above)

Film thickness measurement

±1% 

-

Wavelength display resolution

1nm

Lighting accessory

Dedicated halogen light source, JC12V 55W (Average life: 700 hours)

Shift stage

Loading surface size: 200 (W) x 200 (D) mm 

With stand load: 3 kg 

Operating range: (XY) ±40 mm, (Z) 125 mm

Tilt stage

Loading surface size: 140 (W) x 140 (D) mm 

Withstand load: 1 kg 

Operating range: (XT) ±1*, (YT) ±1*

Weight

Main body: Approx. 26 kg (not including PC)

Main body: Approx. 31 kg (not including PC)*3

Control power box: Approx. 6.7 kg

Dimensions

Main body: 360 (W) x 446 (D) x 606 (H) mm

Main body: 360 (W) x 631 (D) x 606 (H) mm

Control power box: 250 (W) x 270 (D) x 125 (H) mm (Protruding parts are not included)

Power specifications

Input specifications: AC 100-240V (110V) 50/60Hz

Operating environment

Horizontal place not subject to vibration 

Temperature: 15 ºC to 30 ºC 

Humidity: 15% to 60% RH (Free from dew condensation)

*1 Optional unit

*2 Measured under the measurement conditions of our company.

*3 The total weight of both the transmissivity measurement set and 45-degrees reflectivity measurement set installed is approx. 33 kg.

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