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TBB Global Việt Nam

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 Home Application Acquiring High-Quality Images Through Silicon Without Damaging the Finished Product

category Product

• EVIDENT OLYMPUS + Microscope
• CREAFORM + 3D SCANNER
• IIM AG measurement + engineering
  • Cable Measurement
  • Devices for cable sample preparation
• MATSUZAWA + Hardness Tester
  • Rockwell
  • Vicker
  • Micro Vicker
• AlphaMOS Analysis
  • HERACLES Electronic Nose
  • ASTREE Electronic Tongue
  • IRIS Electronic Eye
• BUCHI - Near-infrared Spectrometer
• Nordson + Test & Inspection
• Sample Preparation Machine
  • PRESI
    • CUTTING
    • MOUNTING
    • POLISHING
  • STRUERS
    • CUTTING STRUERS
    • MOUNTING STRUERS
    • Grinding and Polishing STRUERS
  • BUEHLER
    • CUTTING BUEHLER
    • MOUNTING BUEHLER
    • Grinding & Polishing BUEHLER
  • METKON
  • TOP TECH
  • TAIWAN NAKAZAWA
• GLASER + Technical Cleanliness System
• EVIDENT OLYMPUS + XRF and XRD Analyzers

Acquiring High-Quality Images Through Silicon Without Damaging the Finished Product

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